| 摘要 |
PURPOSE: A light emitting diode test device and a light emitting diode test handler including the same are provided to improve stability of the device by preventing loss of a light emitting diode by an external shock. CONSTITUTION: A light emitting diode test device (1) comprises a receiving member (2), an induction unit (3), a rotating member, a driving unit, a connection member (4), a connection unit, and a combining hole. The receiving member receives a light emitting diode. The induction unit absorbs the light emitting diode which is received in the receiving unit. The rotating member is formed by combining multiple receiving members. The driving unit rotates the rotating member so that the receiving member is successively located. The connection member is located under the light emitting diode which is received in the receiving unit in order to be connected to the light emitting diode. The connection unit is installed on a test location and is connected to the connection member in order to electrically connect to the light emitting diode. The combining hole helps combination so that the connection member is connected to the light emitting diode which is received in the receiving unit. [Reference numerals] (3) Induction unit |
