发明名称 debonding method of temporary bonded device wafer and carrier wafer
摘要 PURPOSE: A method for debonding a device wafer is provided to improve production yield of the device wafer by separating the device wafer from a temporary bonding adhesive layer which connects a carrier wafer and the device wafer without damage. CONSTITUTION: A carrier wafer(10), an adhesive layer(20), a protection film layer(30), and a device wafer(40) are successively laminated on the upper side of a dicing frame(60). The dicing frame is loaded on a sliding table(400). Heat is generated in the adhesive layer by applying a microwave to the adhesive layer. The carrier wafer is physically separated from the device wafer. The protection film layer is peel off from the device wafer.
申请公布号 KR101304282(B1) 申请公布日期 2013.09.11
申请号 KR20110051779 申请日期 2011.05.31
申请人 发明人
分类号 H01L21/673;H01L21/677 主分类号 H01L21/673
代理机构 代理人
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