| 摘要 |
PROBLEM TO BE SOLVED: To efficiently perform inspection for specifying a disconnection defect generation position of an image display device without contaminating a substrate.SOLUTION: A diffusion layer 14 to be used as a drain of an FET 17 and an electrode 19 of a charge accumulation capacitor 21 in the same pixel are electrically connected to one pixel electrode 22. A principal part of an inspection substrate 10 has a structure that a conductive film 26 is coated on surfaces of all pixel electrodes 22. The conductive film 26 is electrically connected to all pixel electrodes 22 and electrically connected to an external monitor electrode. An image signal inputted to one selected pixel is compared with a signal supplied to a monitor electrode, and when both the signals are the same, there is no disconnection in a current path from the input side of the selected pixel up to the pixel electrode 22 of the pixel, there is no abnormality in a switching element connected to a column signal line and all components are electrically connected. |
