| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which information on defective memory elements in a redundancy area can be used in later test processes, so as to prevent an increase in screening costs which is caused when a test for the redundancy area is required in the later test processes because information indicating that there is a defective redundant memory element cannot be stored when the defective redundant memory element is found to exist in the redundancy area.SOLUTION: A semiconductor device comprises: memory elements that store data; a defective memory element that is one of the memory elements and determined to be defective; a redundant memory element with which replacement can be done; and a first nonvolatile storage element that stores, when the redundant memory element is determined to be defective, information on the address of the defective redundant memory element. |
