发明名称 |
PROCESS OF FORMING THROUGH-SILICON VIA STRUCTURE |
摘要 |
In a process, an opening is formed to extend from a front surface of a semiconductor substrate through at least a part of the semiconductor substrate. A metal seed layer is formed on a sidewall of the opening. A metal silicide layer is formed on at least one portion of the metal seed layer. A metal layer is formed on the metal silicide layer and the metal seed layer to fill the opening.
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申请公布号 |
US2013224909(A1) |
申请公布日期 |
2013.08.29 |
申请号 |
US201313854230 |
申请日期 |
2013.04.01 |
申请人 |
LTD. TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY,;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
WU WENG-JIN;LIN YUNG-CHI;CHIOU WEN-CHIH |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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