发明名称 PROCESS OF FORMING THROUGH-SILICON VIA STRUCTURE
摘要 In a process, an opening is formed to extend from a front surface of a semiconductor substrate through at least a part of the semiconductor substrate. A metal seed layer is formed on a sidewall of the opening. A metal silicide layer is formed on at least one portion of the metal seed layer. A metal layer is formed on the metal silicide layer and the metal seed layer to fill the opening.
申请公布号 US2013224909(A1) 申请公布日期 2013.08.29
申请号 US201313854230 申请日期 2013.04.01
申请人 LTD. TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY,;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WU WENG-JIN;LIN YUNG-CHI;CHIOU WEN-CHIH
分类号 H01L21/768 主分类号 H01L21/768
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