发明名称 INTERFEROMETER AND FOURIER-TRANSFORM SPECTROSCOPIC ANALYZER
摘要 An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).
申请公布号 US2013222790(A1) 申请公布日期 2013.08.29
申请号 US201113881562 申请日期 2011.09.06
申请人 HIRAO YUSUKE;KONICA MINOLTA INC 发明人 HIRAO YUSUKE
分类号 G01B9/02 主分类号 G01B9/02
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