发明名称 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, MANUFACTURING METHOD OF ELECTRONIC DEVICE USING THE SAME AND ELECTRONIC DEVICE
摘要 <p>There is provided a pattern forming method comprising (A) forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin containing a repeating unit having a phenol skeleton and a repeating unit having a group capable of decomposing by the action of an acid to produce an alcoholic hydroxy group; (B) exposing the film; and (C) developing the exposed film by using an organic solvent-containing developer.</p>
申请公布号 WO2013125733(A1) 申请公布日期 2013.08.29
申请号 WO2013JP55606 申请日期 2013.02.22
申请人 FUJIFILM CORPORATION 发明人 NIHASHI, WATARU;TAKIZAWA, HIROO;HIRANO, SHUJI
分类号 G03F7/039;C08F212/14;C08F220/26;G03F7/004;G03F7/038;G03F7/32;H01L21/027 主分类号 G03F7/039
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