发明名称 Semiconductor device having a high resistance to ionizing radiation
摘要 The semiconductor device includes a semiconductor substrate of a first type. A layer of semiconductor material of a second type is disposed on the semiconductor substrate. A first well and a second well are disposed on the layer. A third well is disposed on the layer between the first and second wells. A memory cell, including a first and a second plurality of transistors of the second type and a third plurality of transistors of the first type, is formed in the first, second, and third wells. The first plurality of transistors is formed in the first well, the second plurality of transistors is formed in the second well, and the third plurality of transistors is formed in the third well. The layer and the third well are configured to isolate the first and second wells from each other and from the semiconductor substrate.
申请公布号 US8519483(B1) 申请公布日期 2013.08.27
申请号 US201113111878 申请日期 2011.05.19
申请人 HART MICHAEL J.;XILINX, INC. 发明人 HART MICHAEL J.
分类号 H01L27/092;G11C11/00;H01L21/70;H01L21/8238 主分类号 H01L27/092
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