发明名称 Semiconductor device manufacturing method and manufacturing apparatus
摘要 A semiconductor device manufacturing method and manufacturing apparatus with which it is possible, when a wafer has a warp, to effectively peel off an ultraviolet peelable tape with ultraviolet irradiation of a short duration. Even when a wafer has a warp, by correcting the warp of the wafer with an ultraviolet transmitting plate, and uniformly irradiating an ultraviolet peelable tape attached to the wafer with ultraviolet light, it is possible to reduce a distance between an ultraviolet light source and the ultraviolet peelable tape. Also, by blocking heat from the ultraviolet light source with the ultraviolet transmitting plate, it is possible to suppress a rise in temperature of the wafer. As a result of this, it is possible to effectively peel the ultraviolet peelable tape from the wafer with ultraviolet irradiation of a short duration without any adhesive residue remaining.
申请公布号 US8518804(B2) 申请公布日期 2013.08.27
申请号 US201113278164 申请日期 2011.10.20
申请人 URANO YUICHI;FUJI ELECTRIC CO., LTD. 发明人 URANO YUICHI
分类号 H01L21/301;H01L21/46;H01L21/78 主分类号 H01L21/301
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