| 摘要 |
<p>The invention herein proposed relates to a method and embodiments of a device enabling testing and/or calibration of the temperature coefficient of an integrated circuit (101) as such. The method according to the present invention relates to the use of measurement data at two temperatures. Based on the measurement data and the signal characteristics of the integrated circuit, which functionally depend upon time, temperature, and load conditions, the temperature coefficient of the integrated circuit may be sorted/ calibrated. The device according to the present invention relates to an integrated circuit combined with an external load circuit, or an integrated circuit with an inbuilt load circuit, wherein said load circuit increases the current in the integrated circuit, whereby the temperature of the integrated circuit is increased as well.</p> |
