发明名称 High Voltage Electrostatic Discharge Clamp Using Deep Submicron CMOS Technology
摘要 An ESD circuit includes a plurality of MOS devices arranged in a stack, wherein each of the MOS devices comprises a source, a drain, and a gate; a voltage source inputting a supply voltage to the stack of MOS devices; a first plurality of resistors dividing the supply voltage to each source and each drain of the MOS devices in the stack; a second plurality of resistors biasing the supply voltage to each gate of the MOS devices in the stack; an inverter device operatively connected to the second plurality of resistors; a time lag circuit that turns the inverter device on and off; and a plurality of capacitors pulling the voltage to each gate of the MOS devices in the stack to the supply voltage upon the inverter device turning off.
申请公布号 US2013215540(A1) 申请公布日期 2013.08.22
申请号 US201213398638 申请日期 2012.02.16
申请人 WANG DEJUN;NEWPORT MEDIA, INC. 发明人 WANG DEJUN
分类号 H02H9/04 主分类号 H02H9/04
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