发明名称 SEMICONDUCTOR DEVICE COMPRISING CAPACITOR AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device, including a memory cell region and a peripheral circuit region, comprises an insulating film, having an upper surface formed on a major surface of a semiconductor substrate to extend from a memory cell region to a peripheral circuit region thereof. A capacitor lower electrode is formed in the memory cell region to upwardly extend beyond the upper surface of the insulating film on the major surface of the semiconductor substrate. A capacitor upper electrode is formed on the capacitor lower electrode through a dielectric film, to extend onto the upper surface of the insulating film. The capacitor lower electrode includes a capacitor lower electrode part having a top surface and a bottom surface. The upper surface of the insulating film is located between the top and bottom surfaces of the capacitor lower electrode part.
申请公布号 US2013214339(A1) 申请公布日期 2013.08.22
申请号 US201313750928 申请日期 2013.01.25
申请人 RENESAS ELECTRONICS CORPORATION;RENESAS ELECTRONICS CORPORATION 发明人 TANAKA YOSHINORI;SHIMIZU MASAHIRO;ARIMA HIDEAKI;MORITA SADAYUKI
分类号 H01L27/06;H01L21/8242;H01L27/108 主分类号 H01L27/06
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