发明名称
摘要 PROBLEM TO BE SOLVED: To provide a surface property measuring instrument properly measuring the surface property of an object to be measured without changing a posture of the object. SOLUTION: A surface property measuring instrument 1 is provided with: a table 3 having a mounting surface 30 for mounting an object to be measured on the top side; a probe 4 having a gauge head 41A for measuring the object being measured at the front edge side; a slider 5 for holding the probe 4; a column 6 that supports the slider 5 and extends toward the direction almost perpendicular to the mounting surface 30; and a support means 7 that is provided at the side surface of the table 3 to support the column 6. The probe 4 is supported by the slider 5 to be movable along the extending direction of the slider 5. The slider 5 is supported by the column 6. The column 6 is supported by the support means 7 to be rotatable in the extending direction of the column 6 as an axial direction. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP5270302(B2) 申请公布日期 2013.08.21
申请号 JP20080281559 申请日期 2008.10.31
申请人 发明人
分类号 G01B5/20;G01B5/28 主分类号 G01B5/20
代理机构 代理人
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