发明名称 Image analysis device and method
摘要 An image analysis device reads a reference image and a real-time image of a printed circuit board (PCB), determines feature points and feature information of the feature points in the reference image; and creates two 1×N matrices based on the feature points. Furthermore, a mapping matrix is determined based on the two 1×N matrices. The device then reads coordinates of base points designated in the reference image, and determines matching points in the real-time image based on the coordinates of base points and the mapping matrix. A reference region in the reference image is determined based on all the base points, and a matching region is determined in the real-time image based on all the matching points. The reference region and the matching region are compared to determine existence of any surface feature defects of the PCB.
申请公布号 US8515156(B2) 申请公布日期 2013.08.20
申请号 US201113211320 申请日期 2011.08.17
申请人 WU WEN-WU;LIU MENG-ZHOU;FU XIAO-JUN;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 WU WEN-WU;LIU MENG-ZHOU;FU XIAO-JUN
分类号 G06K9/62 主分类号 G06K9/62
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