发明名称 |
Image analysis device and method |
摘要 |
An image analysis device reads a reference image and a real-time image of a printed circuit board (PCB), determines feature points and feature information of the feature points in the reference image; and creates two 1×N matrices based on the feature points. Furthermore, a mapping matrix is determined based on the two 1×N matrices. The device then reads coordinates of base points designated in the reference image, and determines matching points in the real-time image based on the coordinates of base points and the mapping matrix. A reference region in the reference image is determined based on all the base points, and a matching region is determined in the real-time image based on all the matching points. The reference region and the matching region are compared to determine existence of any surface feature defects of the PCB.
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申请公布号 |
US8515156(B2) |
申请公布日期 |
2013.08.20 |
申请号 |
US201113211320 |
申请日期 |
2011.08.17 |
申请人 |
WU WEN-WU;LIU MENG-ZHOU;FU XIAO-JUN;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
WU WEN-WU;LIU MENG-ZHOU;FU XIAO-JUN |
分类号 |
G06K9/62 |
主分类号 |
G06K9/62 |
代理机构 |
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代理人 |
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