发明名称 |
Semiconductor device including a phase-change memory element |
摘要 |
A semiconductor device may include, but is not limited to: a first insulating film; a second insulating film over the first insulating film; a first memory structure between the first and second insulating films; and a third insulating film between the first and second insulating films. The first memory structure may include, but is not limited to: a heater electrode; and a phase-change memory element between the heater electrode and the second insulating film. The phase-change memory element contacts the heater electrode. The third insulating film covers at least a side surface of the phase-change memory element. Empty space is positioned adjacent to at least one of the heater electrode and the third insulating film.
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申请公布号 |
US8513638(B2) |
申请公布日期 |
2013.08.20 |
申请号 |
US201113137687 |
申请日期 |
2011.09.02 |
申请人 |
KAKEGAWA TOMOYASU;ASANO ISAMU;KAWAGOE TSUYOSHI;SASAOKA HIROMI;HIGANO NAOYA;WATANABE YUTA;ELPIDA MEMORY, INC. |
发明人 |
KAKEGAWA TOMOYASU;ASANO ISAMU;KAWAGOE TSUYOSHI;SASAOKA HIROMI;HIGANO NAOYA;WATANABE YUTA |
分类号 |
H01L29/02 |
主分类号 |
H01L29/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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