发明名称 Semiconductor device including a phase-change memory element
摘要 A semiconductor device may include, but is not limited to: a first insulating film; a second insulating film over the first insulating film; a first memory structure between the first and second insulating films; and a third insulating film between the first and second insulating films. The first memory structure may include, but is not limited to: a heater electrode; and a phase-change memory element between the heater electrode and the second insulating film. The phase-change memory element contacts the heater electrode. The third insulating film covers at least a side surface of the phase-change memory element. Empty space is positioned adjacent to at least one of the heater electrode and the third insulating film.
申请公布号 US8513638(B2) 申请公布日期 2013.08.20
申请号 US201113137687 申请日期 2011.09.02
申请人 KAKEGAWA TOMOYASU;ASANO ISAMU;KAWAGOE TSUYOSHI;SASAOKA HIROMI;HIGANO NAOYA;WATANABE YUTA;ELPIDA MEMORY, INC. 发明人 KAKEGAWA TOMOYASU;ASANO ISAMU;KAWAGOE TSUYOSHI;SASAOKA HIROMI;HIGANO NAOYA;WATANABE YUTA
分类号 H01L29/02 主分类号 H01L29/02
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