| 摘要 |
Provided are a microcrystal structure analysis device, a microcrystal structure analysis method, and an x-ray shield device, with which it is possible to obtain a favorable x-ray diffraction image even when illuminating a pseudo-single crystal sample with x-rays while rotating same. This microcrystal structure analysis device (1) comprises: a magnetic field emission unit (12); a sample drive unit (13) which rotates, with respect to the magnetic field emission unit (12), a sample container (2), which houses a sample in which microcrystals (3) are suspended, such that a magnetic field which fluctuates temporally is applied to the sample container (2) and the microcrystals (3) are three-dimensionally oriented; an x-ray source (21) which illuminates the sample container (2), which is being rotated by the sample drive unit (13), with an x-ray (a); an x-ray detector unit (23) which is capable of detecting x-rays (a) which pass through and are diffracted by the sample container (2); and a state switch device (G) which switches, according to the rotation location of a specific site (2a) which is a portion of the sample container (2) in the rotation direction, between a state in which the x-rays (a) cannot be detected by the x-ray detector unit (23) and a state in which the x-rays (a) can be detected by the x-ray detector unit (23). |
