| 摘要 |
A test system may be provided in which devices under test are loaded into test trays. Each test tray may include clamps for retaining a device under test within the test tray. The test tray may be configured to transmit test tray identification information to facilitate tracking of the device under test associated with the test tray. The test tray may include engagement features configured to receive corresponding engagement features on a computer-controlled loading arm. The loading arm may be used to move the test tray and associated device under test to a test fixture for testing. A contact extending structure may be retained in the test tray and may be configured to mate with the device under test. Contact pads on the contact extending structure may be mated with corresponding contacts on the test fixture to form an electrical connection between the device under test and the test fixture. |
