发明名称 POST-PASSIVATION INTERCONNECT STRUCTURE AMD METHOD OF FORMING SAME
摘要 A semiconductor device including a dielectric layer formed on the surface of a post-passivation interconnect (PPI) structures. A polymer layer is formed on the dielectric layer and patterned with an opening to expose a portion of the dielectric layer. The exposed portion of the dielectric layer is then removed to expose a portion of the PPI structure. A solder bump is then formed over and electrically connected to the first portion of the PPI structure.
申请公布号 US2013207258(A1) 申请公布日期 2013.08.15
申请号 US201213370895 申请日期 2012.02.10
申请人 CHEN HSIEN-WEI;WU YI-WEN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN HSIEN-WEI;WU YI-WEN
分类号 H01L23/498;H01L21/768 主分类号 H01L23/498
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