发明名称 TIME-OF-FLIGHT MASS SPECTROMETER WITH ACCUMULATING ELECTRON IMPACT ION SOURCE
摘要 An accumulating ion source for a mass spectrometer that includes a sample injector (328) introducing sample vapors into an ionization space (115) and an electron emitter (102) emitting a continuous electron beam (104) into the ionization space (115) to generate analyte ions. The accumulating ion source further includes first and second electrodes (108a, 108b) arranged spaced apart in the ionization space (115) for accumulating analyte ions substantially therebetween. The first and second electrodes (108a, 108b) receive periodic extraction energy potentials to accelerate packets of analyte ions from the ionization space (115) along a first axis. An orthogonal accelerator (140) receives the packets of analyte ions along the first axis and periodically accelerates the packets of analyte ions along a second axis substantially orthogonal to the first axis. A time delay between the extraction acceleration and the acceleration of each respective packet of analyte ions provides a proportional mass range of the respective packet of analyte ions.
申请公布号 US2013206978(A1) 申请公布日期 2013.08.15
申请号 US201113817519 申请日期 2011.08.18
申请人 VERENCHIKOV ANATOLY N.;KHASIN YURI;LECO CORPORATION 发明人 VERENCHIKOV ANATOLY N.;KHASIN YURI
分类号 H01J49/14;H01J49/00 主分类号 H01J49/14
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