发明名称 VISION INSPECTION APPARATUS USING MULTIPLE GRID PATTERN
摘要 The present invention relates to a vision testing device using a multigrid pattern for determining good or bad of a testing object by photographing the testing object assembled or mounted during the component assembly process and comparing the photographed image with a previously inputted target image, comprising: a stage part for fixing or transferring the testing object to the testing location; a lighting part for providing lighting to the testing object located on an upper portion of the stage part; a center camera part for obtaining a 2-dimensional image of the testing object located in a center of the lighting part; a irradiating part placed on a side section of the center camera part; a vision processing unit for reading the image photographed by the center camera part and determining good or bad of the testing object; and a control unit for controlling the stage part, the grid pattern irradiating part, the center camera part, wherein the grid pattern irradiating part irradiates grid patterns having periods of different intervals.
申请公布号 KR101295760(B1) 申请公布日期 2013.08.13
申请号 KR20110021427 申请日期 2011.03.10
申请人 发明人
分类号 G01B11/25;G01N21/956;H05K13/08 主分类号 G01B11/25
代理机构 代理人
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