发明名称 |
Interferometric systems having reflective chambers and related methods |
摘要 |
Disclosed herein are interferometric systems having reflective chambers and related methods. According to an aspect, an interferometric system may include a light source for generating an illumination beam that propagates towards a sample. A sample holder may hold the sample and include a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis. The cover may be oriented at an angle for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis. An imaging module may redirect the reference beam towards the optical axis at a detection plane. A detector may intercept the sample and reference beams and may generate a holographic representation of the sample based on the beams.
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申请公布号 |
US8508746(B2) |
申请公布日期 |
2013.08.13 |
申请号 |
US201113072294 |
申请日期 |
2011.03.25 |
申请人 |
WAX ADAM;ZHU YIZHENG;SHAKED NATAN TZVI;DUKE UNIVERSITY |
发明人 |
WAX ADAM;ZHU YIZHENG;SHAKED NATAN TZVI |
分类号 |
G01B9/021 |
主分类号 |
G01B9/021 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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