| 摘要 |
PURPOSE: A device and a method of testing a NAND-type flash memory are provided to reduce test costs by adding a test performance improving unit. CONSTITUTION: A test performance improving unit (20) separately has a write path and a read path. The test performance improving unit has a high speed DDR pattern generator (21) and a high speed DDR comparator (22). The DDR pattern generator outputs a test pattern in a high speed DDR interface method on the write path. The high speed DDR comparator determines pass and fail by comparing data read from a NAND-type flash memory in the high speed DDR interface method and the test pattern in the high speed DDR interface method and selectively transmits necessary information to a low speed test unit by compressing the determined result with a bit or an address. |
