| 摘要 |
PURPOSE: A probe is provided to test the semiconductor device by using other wires of a bundle of wires even when at least one of the wires is worn or damaged, thereby extending the life of the probe. CONSTITUTION: An upper plunger (20) is electrically connected to a semiconductor device (2). A lower plunger (40) is electrically connected to a tester (6). An internal elastic member (60) elastically biases at least one of the upper plunger and the lower plunger to allow the upper plunger and the lower plunger to be spaced apart from each other. A barrel (80) receives the internal elastic member. The at least one of the upper plunger and the lower plunger is made of metal materials and includes a receiving groove (22) in the end portion thereof. A bundle (24) of conductive wires is arranged on the receiving groove to expose a part of the bundle. |
