发明名称 Non-CCD imaging device with Time Delay Integration (TDI) mode
摘要 <p>A non-CCD imaging device for scan-imaging radiation in a Time Delay Integration (TDI) mode comprising an image cell array including an array of detector cells for generating charge in response to incident radiation and a corresponding array of pixel circuits comprising accumulation circuitry for accumulating pixel image values corresponding to incident radiation on respective detector cells, each pixel circuit being associated with a respective detector cell and controllable to transfer a pixel image value to an adjacent pixel circuit, said pixel circuit operable to receive a pixel image value from an adjacent pixel circuit, wherein said pixel image value comprises a charge packet, and said accumulation circuitry comprises a first charge collection means couplable to said detector for storing a charge packet corresponding to a pixel image value and further couplable to a second charge collection means of a preceding pixel circuit for receiving and accumulating charge from said preceding circuit, each said pixel circuit including transfer circuitry comprising a second charge collection means couplable to charge accumulation circuitry of a succeeding pixel circuit for receiving said charge packet from said first charge collection means during charge transfer to a succeeding pixel circuit, and further comprising first and second switch means respectively associated with said first and second charge collection means operable to transfer said charge packet in first and second steps utilising said first and second charge collection means for each step, said switch means operable in anti-phase for transferring said charge packet between adjacent pixel circuits.</p>
申请公布号 EP1667428(B1) 申请公布日期 2013.08.07
申请号 EP20060004614 申请日期 1999.10.12
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SPARTIOTIS, KONSTANTINOS EVANGELOS;JURTHE, STEFAN;ERALUOTO, MARKKU TAPIO
分类号 G01T1/24;H04N5/335;H01L27/14;H04N5/32;H04N5/372;H04N5/374 主分类号 G01T1/24
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