发明名称 IMAGING METHOD AND IMAGING APPARATUS
摘要 PROBLEM TO BE SOLVED: To correct unevenness of a top dark part with a high electron multiplication factor of an electron multiplication type CCD imaging element.SOLUTION: An imaging apparatus includes: an electron multiplication type CCD imaging element; a first acquisition section for acquiring an image signal outputted from an effective pixel of a light receiving face of the CCD imaging element; a second acquisition section for acquiring a signal outputted from a shielded pixel in at least one of a top part and a bottom part of the light receiving face of the CCD imaging element; and a dark part correction section for correcting dark part unevenness. The imaging apparatus also includes means for calculating a first representative value such as a center value and a lower limit value of the signal outputted from the shielded pixel acquired in the second acquisition section. The dark part correction section corrects the dark part unevenness of a video signal in a horizontal scanning period of a screen upper end part from which a vertical video period starts after a vertical feedback period ends in proportional correlation with an average of a vertical period or more of the representative value of the signal outputted from the shielded pixel and subtracts a screen upper end correction signal obtained by multiplying a screen upper end unevenness signal which is previously prepared by the average of the vertical period or more of the representative value from the video signal of the horizontal scanning period of the screen upper end part.
申请公布号 JP2013150144(A) 申请公布日期 2013.08.01
申请号 JP20120008929 申请日期 2012.01.19
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 MUTO YUTAKA;NAKAMURA KAZUHIKO
分类号 H04N5/243;H04N5/361;H04N5/372 主分类号 H04N5/243
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