MODIFICATION OF SOLID STATE CdZnTe (CZT) RADIATION DETECTORS WITH HIGH SENSITIVITY OR HIGH RESOLUTION OPERATION

摘要

An apparatus and process is provided to illustrate the manipulation of the internal electric field of CZT using multiple wavelength light illumination on the crystal surface at RT. The control of the internal electric field is shown through the polarization in the IR transmission image under illumination as a result of the Pockels effect.