发明名称 |
READING CIRCUIT OF NONVOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: A readout circuit of a non-volatile memory device is provided to control each gate of an NMOS transistor with the same voltage by applying a voltage output from a single bias circuit, thereby having a large readout margin for distinguishing between data 0 and 1. CONSTITUTION: A memory element (11) has a source connected to a ground voltage (20) and a gate connected to one end of a first memory element selection switch (15). A select gate transistor (12) is controlled to be turned on and off by a select gate selection control signal (17). A second memory element selection switch (14) is controlled to be turned on and off by a memory element selection control signal. A current mirror circuit includes a first PMOS transistor and a second PMOS transistor. A first bias circuit (30) has an output terminal connected to a gate of a first NMOS transistor and the other end of the first memory element selection switch. [Reference numerals] (30) Bias circuit A |
申请公布号 |
KR20130086310(A) |
申请公布日期 |
2013.08.01 |
申请号 |
KR20130007302 |
申请日期 |
2013.01.23 |
申请人 |
SEIKO INSTRU KABUSHIKI KAISHA, ALSO TRADING AS SEIKO INSTRUMENTS INC. |
发明人 |
SATO YUTAKA |
分类号 |
G11C16/26 |
主分类号 |
G11C16/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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