| 摘要 |
PROBLEM TO BE SOLVED: To perform the repair and characteristic adjustment of memories for each group.SOLUTION: A semiconductor integrated circuit device (10) comprises: a BIST circuit (17) that generates individual-group's repair availability information and an individual-group's repair code for each repair group that is preset for a plurality of memories; an adjustment code control circuit (15) that obtains an adjustment code for each characteristic adjustment group that is preset for the plurality of memories; and a control circuit (13) to which the repair codes and adjustment codes for repairable groups are set. The adjustment code control circuit changes the adjustment codes for unrepairable groups that are identified as being unrepairable on the basis of the individual-group's repair availability information. The BIST circuit regenerates the individual-group's repair availability information and individual-group's repair code, after the adjustment codes is changed by the adjustment code control circuit. Repair and characteristic adjustment of the memories can be performed for each group. |
