发明名称 METHOD FOR PRODUCING A SEMICONDUCTOR WAFER
摘要 Semiconductor wafers are produced by a process of: a) providing a semiconductor wafer by cutting a silicon ingot into wafers; b) rounding the edge of the wafer, so that the wafer comprises plane surfaces on the frontside and backside and rounded oblique surfaces in the edge region; c) polishing the frontside and backside of the wafer, the frontside being polished by chemical-mechanical polishing using a polishing pad which is free of abrasive fixed in the polishing pad; backside polishing being carried out in three steps, using a polishing pad containing fixed abrasive which is pressed onto the backside of the wafer, a polishing agent free of solids introduced between the polishing pad and the backside of the wafer in the first step, a polishing agent containing abrasive being introduced in the second and third steps, a polishing pressure of 8-15 psi in the first and second steps being reduced to 0.5-5 psi in the third step.
申请公布号 KR101291880(B1) 申请公布日期 2013.07.31
申请号 KR20100051121 申请日期 2010.05.31
申请人 发明人
分类号 B24B37/04;H01L21/304 主分类号 B24B37/04
代理机构 代理人
主权项
地址