发明名称 METHOD OF RECORDING TEMPORARY DEFECT LIST ON WRITE-ONCE RECORDING MEDIUM, METHOD OF REPRODUCING THE TEMPORARY DEFECT LIST, RECORDING AND/OR REPRODUCING APPARATUS, AND THE WRITE-ONCE RECORDING MEDIUM
摘要 A METHOD OF RECORDING A TEMPORARY DEFECT LIST (TDFL) ON A WRITE-ONCE RECORDING MEDIUM (100), A METHOD OF REPRODUCING THE TEMPORARY DEFECT LIST, AN APPARATUS FOR RECORDING AND/OR REPRODUCING THE TEMPORARY DEFECT LIST, AND THE WRITE-ONCE RECORDING MEDIUM. THE METHOD OF RECORDING A TEMPORARY DEFECT LIST FOR DEFECT MANAGEMENT ON A WRITE-ONCE RECORDING MEDIUM INCLUDES RECORDING THE TEMPORARY DEFECT LIST, WHICH IS CREATED WHILE DATA IS RECORDED ON THE WRITE-ONCE RECORDING MEDIUM, IN AT LEAST ONE CLUSTER OF THE WRITE-ONCE RECORDING MEDIUM, AND VERIFYING IF A DEFECT IS GENERATED IN THE AT LEAST ONE CLUSTER. THEN, THE METHOD INCLUDES RE-RECORDING DATA ORIGINALLY RECORDED IN A DEFECTIVE CLUSTER IN ANOTHER CLUSTER, AND RECORDING POINTER INFORMATION, WHICH INDICATES A LOCATION OF THE AT LEAST ONE CLUSTER WHERE THE TEMPORARY DEFECT LIST IS RECORDED, ON THE WRITE-ONCE RECORDING MEDIUM.
申请公布号 MY149257(A) 申请公布日期 2013.07.31
申请号 MY2004PI01533 申请日期 2004.04.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUNG-HEE HWANG;JUNG-WAN KO
分类号 G11B7/007;G11B20/18 主分类号 G11B7/007
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