发明名称 Semiconductor device, semiconductor device testing method, and data processing system
摘要 To include one or a plurality of internal signal lines that electrically connects an interface chip to a core chip. The interface chip includes a first circuit that outputs a current to an internal wiring and the core chip includes a second circuit that outputs a current to the first internal signal line. The interface chip includes a determination circuit that has a first input terminal connected to the internal wiring through which the current outputted by the first circuit flows and a second input terminal connected to an end of the first internal signal line in the interface chip, and outputs a voltage according to a potential difference between a voltage of the first input terminal and a voltage of the second input terminal.
申请公布号 US8498831(B2) 申请公布日期 2013.07.30
申请号 US20100923831 申请日期 2010.10.08
申请人 IDE AKIRA;YOKO HIDEYUKI;SHIBATA KAYOKO;TANAMACHI KENICHI;EGUCHI TAKANORI;SHIGEZANE YASUYUKI;OGAWA NAOKI;HIDAKA KAZUO;ELPIDA MEMORY, INC. 发明人 IDE AKIRA;YOKO HIDEYUKI;SHIBATA KAYOKO;TANAMACHI KENICHI;EGUCHI TAKANORI;SHIGEZANE YASUYUKI;OGAWA NAOKI;HIDAKA KAZUO
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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