发明名称 PROCESSING APPARATUS AND PROCESS STATUS CHECKING METHOD
摘要 A processing apparatus includes a processing chamber, gas supply paths provided in a corresponding relationship with the kinds of process gases supplied into the processing chamber, and valves respectively arranged in the gas supply paths. The apparatus further includes a measuring unit for measuring a physical parameter associated with each of the process gases passing through the gas supply paths, a register unit which stores the physical parameter, and a control unit configured to determine a process status based on the physical parameter stored in the register unit. The register unit is provided in a lower-hierarchy control device connected to the control unit of a higher hierarchy to transmit and receive signals to and from the control unit. The lower-hierarchy control device is configured to control input and output signals between the control unit and end devices under the control of the control unit.
申请公布号 US2013186332(A1) 申请公布日期 2013.07.25
申请号 US201313748988 申请日期 2013.01.24
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON LIMITED 发明人 HIROSE KATSUHITO;MIYAZAWA TOSHIO;HIRATA TOSHIHARU;TANAKA TOSHIMASA
分类号 C23C16/52 主分类号 C23C16/52
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