发明名称 |
METHOD AND DEVICE FOR CONVERTING X-RAYS USING A DIRECTLY-CONVERTING SEMICONDUCTOR LAYER |
摘要 |
PURPOSE: A method and a device for converting X-rays using a directly-converting semiconductor layer are provided to reduce a detector drift caused by a polarization effect in the semiconductor layer of an X-ray detector. CONSTITUTION: X-rays are irradiated to a semiconductor layer (4) through a surface (6). The semiconductor layer is irradiated with infrared radiation (3) parallel to the surface through one or more boundary surfaces among lateral boundary surfaces (7). The intensity profile of the infrared radiation is set so that the intensity of the infrared radiation is decreased from the surface over the thickness of the semiconductor layer.
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申请公布号 |
KR20130084256(A) |
申请公布日期 |
2013.07.24 |
申请号 |
KR20130004300 |
申请日期 |
2013.01.15 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
SCHROETER CHRISTIAN |
分类号 |
H01L31/115 |
主分类号 |
H01L31/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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