BLOCK STRUCTURE USING APPARATUS FOR TESTING ELECTRONIC DEVICE AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICE INCLUDING THE SAME

摘要

PURPOSE: A block structure for an electronic element test device and the electronic element test device including the same are provided to stably test an electronic element by moving a probe pin along with a guide block. CONSTITUTION: A block structure for an electronic element test device includes a guide block (10). The guide block has a hole formed in the vertical direction and a probe pin (30) arranged in the hole. The probe pin includes a pin body (31) and an elastic member (33). The lower end of the pin body is in contact with an electronic element. The elastic member includes a combination part to connect the upper part of the pin body. The upper end of the elastic member is connected to a flexible printed circuit board. The guide block includes a first guide block (11) and a second guide block (13). The first guide block is formed vertically and has a first hole. The second guide block is arranged on the lower side of the first guide block. The elastic member is arranged in the first hole, and the pin body is arranged in the second hole.