| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device that easily detects whether or not a data holding circuit such as a latch and a flip-flop in a circuit controls data holding in synchronization with an external clock by using any of static verification and dynamic timing verification.SOLUTION: The semiconductor testing device of the present invention comprises: a simulation section for performing dynamic timing verification on signal level of the terminals of the data holding circuit that controls data holding by the external clock within the circuit, for each of a plurality of external clocks of different frequencies, and for writing and storing a verification result into a storage section as waveform data for each frequency of the external clock; and a waveform comparison section for reading the waveform data from the storage section, comparing waveform shapes of the signal levels at the terminals of the data holding circuit among different frequencies of the external clock, and thereby determining whether or not the data holding circuit is synchronously-controlled for the external clock. |
