发明名称 |
METHOD AND SYSTEM FOR DETERMINING THE QUALITY OF A STORAGE SYSTEM |
摘要 |
<p>In accordance with an exemplary embodiment of the present invention, a method (100) for measuring a quality parameter of an optical storage system comprising a non-diffraction-limited optical storage medium and a readout device, the method comprising the process of deriving (110) an impulse response of the optical storage system, and the process of analyzing (120) the impulse response to determine at least one of a width of the impulse response and a skewness of the impulse response as the quality parameter.</p> |
申请公布号 |
EP2614502(A1) |
申请公布日期 |
2013.07.17 |
申请号 |
EP20110754379 |
申请日期 |
2011.09.06 |
申请人 |
THOMSON LICENSING |
发明人 |
HEPPER, DIETMAR;THEIS, OLIVER;CHEN, XIAO-MING;HOELZEMANN, HERBERT;PILARD, GAEL |
分类号 |
G11B7/125;G11B7/24;G11B20/10 |
主分类号 |
G11B7/125 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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