| 摘要 |
PURPOSE: A frame structure, a test handler for the handling, and a method for testing a substrate by the test handler are provided to connect the memory substrate to a test chamber, regardless of the standard of the memory substrate. CONSTITUTION: A frame structure (10) comprises a fixing plate (20) and a test pad unit (30). The fixing plate fixes a memory plate by including a frame (22), which is formed to secure the internal space, or a bridge (24) which connects the memory substrate to the frame in the internal space. The test pad unit is formed in the frame and connects to the external test chamber while being electrically connected to the memory substrate, in order to test the electrical characteristic of the memory substrate. |
