发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING BURIED WIRING AND RELATED DEVICE
摘要 According to example embodiments of inventive concepts, a method of fabricating a semiconductor device includes forming a sacrificial pattern having SiGe on a crystalline silicon substrate. A body having crystalline silicon is formed on the sacrificial pattern. At least one active element is formed on the body. An insulating layer is formed to cover the sacrificial pattern, the body, and the active element. A contact hole is formed to expose the sacrificial pattern through the insulating layer. A void space is formed by removing the sacrificial pattern. An amorphous silicon layer is formed in the contact hole and the void space. The amorphous silicon layer is transformed into a metal silicide layer.
申请公布号 US2013178048(A1) 申请公布日期 2013.07.11
申请号 US201213550814 申请日期 2012.07.17
申请人 SUN MIN-CHUL;PARK BYUNG-GOOK;SNU R&DB FOUNDATION;SAMSUNG ELECTRONICS CO., LTD. 发明人 SUN MIN-CHUL;PARK BYUNG-GOOK
分类号 H01L21/20 主分类号 H01L21/20
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