| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate work device and an X-ray inspection device which inhibit a stopper part from becoming an obstacle to an operation conducted to a substrate.SOLUTION: An X-ray inspection device 100 (a substrate work device) includes: a substrate transfer part 2 transferring a substrate 10; and a main stopper 6 provided independently from the substrate transfer part 2, stopping the substrate 10 at a predetermined transfer position, and positioning the substrate 10. The main stopper 6 is formed so as to withdraw relative to the substrate transfer part 2 for avoiding interference with the operation conducted to the substrate 10. |
