发明名称 |
TESTING CIRCUIT FOR DC-DC CONVERTER |
摘要 |
Provided is a testing circuit capable of testing functionality of various DC-DC converters without an inductor. According to the present invention, various electronic elements forming the testing circuit for a DC-DC converter are converted in the same kinds of elements or different elements in one-to-one or one-to-two or more correspondence to electronic elements forming a typical DC-DC converter. When the conversion is performed, the electronic values of the elements may be properly scaled to test the DC-DC converter without consuming high power. Therefore, various problems of the related art are minimized.
|
申请公布号 |
US2013169310(A1) |
申请公布日期 |
2013.07.04 |
申请号 |
US201213729335 |
申请日期 |
2012.12.28 |
申请人 |
SILICON WORKS CO., LTD.;SILICON WORKS CO., LTD. |
发明人 |
WOO YOUNG JIN;JEON IN SUN;KWON BO MIN |
分类号 |
G01R31/40 |
主分类号 |
G01R31/40 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|