发明名称 TESTING CIRCUIT FOR DC-DC CONVERTER
摘要 Provided is a testing circuit capable of testing functionality of various DC-DC converters without an inductor. According to the present invention, various electronic elements forming the testing circuit for a DC-DC converter are converted in the same kinds of elements or different elements in one-to-one or one-to-two or more correspondence to electronic elements forming a typical DC-DC converter. When the conversion is performed, the electronic values of the elements may be properly scaled to test the DC-DC converter without consuming high power. Therefore, various problems of the related art are minimized.
申请公布号 US2013169310(A1) 申请公布日期 2013.07.04
申请号 US201213729335 申请日期 2012.12.28
申请人 SILICON WORKS CO., LTD.;SILICON WORKS CO., LTD. 发明人 WOO YOUNG JIN;JEON IN SUN;KWON BO MIN
分类号 G01R31/40 主分类号 G01R31/40
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