发明名称 NONCONTACT IMAGING METHOD FOR NONDESTRUCTIVE TESTING
摘要 PURPOSE: A non-contact type imaging device for a nondestructive inspection and a method thereof are provided to sense even a small damage with the high reliability by forming guided wave images having a spatial resolution and temporal resolution. CONSTITUTION: A non-contact type imaging device for a nondestructive inspection comprises a laser generating unit(10), a measuring unit(20), and an image processing unit(30). The laser generating unit irradiates pulse lasers to a structure(40) and emits guided waves to the structure. The measuring unit measured the guided waves generated in the structure in non-contact type. The image processing unit portrays converts the measured data into images and extracts automatically distinguishes damage information.
申请公布号 KR101281582(B1) 申请公布日期 2013.07.03
申请号 KR20100112990 申请日期 2010.11.12
申请人 发明人
分类号 G01B11/16;G01N21/88 主分类号 G01B11/16
代理机构 代理人
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