发明名称 |
SEMICONDUCTOR MEMORY SYSTEM |
摘要 |
PURPOSE: A semiconductor memory system is provided to improve the reliability of the semiconductor memory system by performing tests of each component and a connection state. CONSTITUTION: Multiple semiconductor memories are laminated in a data storage unit. An interposer connects a logic die (40-1) and a controller. The controller is arranged on the interposer and controls the data storage unit. The logic die is connected to the data storage unit. The logic die generates a test pattern, outputs the test pattern to the data storage unit according to a test mode or to the controller through the interposer, receives a return pattern signal outputted from the data storage unit or the controller, and compares the test pattern and the return pattern signal. [Reference numerals] (41) Test patter generator; (42) Output selector; (43) Input selector; (44,45) Receiver for memory; (46) Transmitter for controller; (47) Receiver for controller; (48) Comparator |
申请公布号 |
KR20130072854(A) |
申请公布日期 |
2013.07.02 |
申请号 |
KR20110140459 |
申请日期 |
2011.12.22 |
申请人 |
SK HYNIX INC. |
发明人 |
YANG, HYUNG GYUN;LEE, HYUNG DONG;KWON, YONG KEE;MOON, YOUNG SUK;KIM, SUNG WOOK |
分类号 |
G11C29/10 |
主分类号 |
G11C29/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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