发明名称 ALLOYED 2N COPPER WIRE FOR BONDING IN MICROELECTRONICS DEVICE
摘要 An alloyed 2N copper wire for bonding in microelectronics contains 2N copper and one or more corrosion resistance alloying materials selected from Ag, Ni, Pd, Au, Pt, and Cr. A total concentration of the corrosion resistance alloying materials is between about 0.009 wt % and about 0.99 wt %.
申请公布号 SG190481(A1) 申请公布日期 2013.06.28
申请号 SG20110089109 申请日期 2011.12.01
申请人 HERAEUS MATERIALS TECHNOLOGY GMBH & CO. KG. 发明人 SARANGAPANI MURALI;YEUNG PING HA;EUGEN MILKE
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