发明名称 |
ION IMPLANTATION ION SOURCE, SYSTEM, AND METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an ion source and a method which deserve production and in which a novel source material (especially, decaborane novel in an ion implantation process and a thermosensitive material such as hydride and dimer-containing compound) can be used, thus to attain a novel range of performance in ion implantation in commercial field of a semiconductor wafer. <P>SOLUTION: An ion source (1) for an ion implantation system includes: an evaporator (2) for generating process gas; an electron source (12) in which the process gas in an ionization enclosure (16) is ionized by directing an electron beam (32); a beam dump (11); an ionization chamber (5); and an extraction aperture (37) for taking out an ion beam. A control system includes a control system which allows control of energy of primary electrons so that individual vapor or gas molecules are ionized mainly by collision with the primary electrons from an electron gun. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013127976(A) |
申请公布日期 |
2013.06.27 |
申请号 |
JP20130016451 |
申请日期 |
2013.01.31 |
申请人 |
SEMEQUIP INC |
发明人 |
HORSKY THOMAS N;WILLIAMS JOHN N |
分类号 |
H01J27/20;H01J27/14;H01J37/08;H01J37/317;H01L21/265 |
主分类号 |
H01J27/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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