发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, PROCESSING METHOD OF SEMICONDUCTOR WAFER, SEMICONDUCTOR WAFER
摘要 A disclosed method of manufacturing a semiconductor device includes forming a groove on a first surface of a semiconductor wafer along an outer periphery of the semiconductor wafer, forming a semiconductor device on the first surface, forming an adhesive layer on the first surface to cover the semiconductor device, bonding a support substrate to the first surface by the adhesive layer, grinding after the adhering of the support substrate a second surface of the semiconductor wafer opposite to the first surface, and dicing after the grinding the semiconductor wafer into individual semiconductor chips.
申请公布号 US2013161795(A1) 申请公布日期 2013.06.27
申请号 US201213650465 申请日期 2012.10.12
申请人 FUJITSU SEMICONDUCTOR LIMITED;FUJITSU SEMICONDUCTOR LIMITED 发明人 OWADA TAMOTSU
分类号 H01L21/78;H01L23/544 主分类号 H01L21/78
代理机构 代理人
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