发明名称 |
SAMPLE GAS ANALYZING DEVICE AND COMPUTER PROGRAM FOR THE SAME |
摘要 |
The present invention is intended to make reduction of interference influence and reduction of a measurement error compatible in a quantitative analysis of one or more measurement target components and to provide a analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample using a spectral spectrum obtained by irradiating light to the sample, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.
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申请公布号 |
US2013166225(A1) |
申请公布日期 |
2013.06.27 |
申请号 |
US201213724255 |
申请日期 |
2012.12.21 |
申请人 |
HORIBA, LTD.;HORIBA, LTD. |
发明人 |
ITAYA TAKAHIRO;NAKATANI SHIGERU |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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