发明名称 SAMPLE GAS ANALYZING DEVICE AND COMPUTER PROGRAM FOR THE SAME
摘要 The present invention is intended to make reduction of interference influence and reduction of a measurement error compatible in a quantitative analysis of one or more measurement target components and to provide a analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample using a spectral spectrum obtained by irradiating light to the sample, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.
申请公布号 US2013166225(A1) 申请公布日期 2013.06.27
申请号 US201213724255 申请日期 2012.12.21
申请人 HORIBA, LTD.;HORIBA, LTD. 发明人 ITAYA TAKAHIRO;NAKATANI SHIGERU
分类号 G06F19/00 主分类号 G06F19/00
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