发明名称 Semiconductor device and manufacturing method of the same
摘要 A trench is formed so as to reach a p--type epitaxial layer from an upper surface of a source region. A gate electrode is formed so as to bury the trench. Each of body contact trenches is formed away from the gate electrode. A body contact region is formed at the bottom of the body contact trench. An n-type semiconductor region that is a feature of the present invention is formed in a layer below each body contact region. The impurity concentration of the n-type semiconductor region is higher than a channel forming area and lower than the body contact region.
申请公布号 US8471333(B2) 申请公布日期 2013.06.25
申请号 US201213540586 申请日期 2012.07.02
申请人 MATSUURA HITOSHI;NAKAZAWA YOSHITO;RENESAS ELECTRONICS CORPORATION 发明人 MATSUURA HITOSHI;NAKAZAWA YOSHITO
分类号 H01L27/06 主分类号 H01L27/06
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