发明名称 SEMICONDUCTOR DEVICE INCLUDING STEP INDEX GATE ELECTRODE AND FABRICATION METHOD THEREOF
摘要 <p>PURPOSE: A semiconductor device including a step gate electrode and a manufacturing method thereof are provided to increase a breakdown voltage by using optical photoresist and two nitride layers. CONSTITUTION: A cap layer(211) is formed on a semiconductor substrate. An active area is formed by etching a part of the cap layer. A resist pattern is formed on the active area and the cap layer. A step gate electrode(225) is formed by depositing heat-resistant metal. An insulation layer(227) is deposited by removing a gate head pattern.</p>
申请公布号 KR20130066934(A) 申请公布日期 2013.06.21
申请号 KR20110133715 申请日期 2011.12.13
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YOON, HYUNG SUP;MIN, BYOUNG GUE;LEE, JONG MIN;KIM, SEONG IL;KANG, DONG MIN;AHN, HO KYUN;LIM, JONG WON;MUN, JAE KYOUNG;NAM, EUN SOO
分类号 H01L21/338;H01L29/812 主分类号 H01L21/338
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