发明名称 Method of forming a low resistance semiconductor contact and structure therefor
摘要 In one embodiment, silicide layers are formed on two oppositely doped adjacent semiconductor regions. A conductor material is formed electrically contacting both of the two silicides.
申请公布号 KR101277519(B1) 申请公布日期 2013.06.21
申请号 KR20060092507 申请日期 2006.09.22
申请人 发明人
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
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