发明名称 SEMICONDUCTOR DEVICE
摘要 A MOSFET includes: a substrate having a trench formed therein and made of silicon carbide, the trench being opened on one main surface side and having a side wall surface; a gate insulating film formed on the side wall surface in contact therewith; and a gate electrode formed on the gate insulating film in contact therewith, wherein a square region with each side of 100 nm in the side wall surface has a surface roughness of not more than 1.0 nm in RMS.
申请公布号 US2013153925(A1) 申请公布日期 2013.06.20
申请号 US201213679511 申请日期 2012.11.16
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MASUDA TAKEYOSHI
分类号 H01L29/78 主分类号 H01L29/78
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